This inventor holds 1 USPTO granted patent. Top assignees: Maeda Corporation Limited, Sakata Denki Co., Ltd.. Active years: 1996.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1996
Title: Hitoshi Arai: Innovator in Leakage Detection Technology
Introduction
Hitoshi Arai is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of leakage detection technology, particularly through his innovative methods for identifying damage in impervious sheets. His work has implications for various industries, enhancing safety and efficiency in construction and engineering.
Latest Patents
Hitoshi Arai holds a patent for a method of measuring leakage positions in impervious bottom sheets. This method involves the use of electrode units placed on both sides of the impervious sheet. By short-circuiting electrodes and supplying an AC voltage, Arai's technique allows for the detection of damage by measuring potential differences and phase-detecting voltage signals. This innovative approach enables the precise identification of leakage locations, which is crucial for maintaining the integrity of structures.
Career Highlights
Throughout his career, Hitoshi Arai has worked with prominent companies such as Sakata Denki Co., Ltd. and Maeda Corporation Limited. His experience in these organizations has allowed him to refine his skills and contribute to significant projects in the field of engineering and technology.
Collaborations
Hitoshi Arai has collaborated with notable individuals in his field, including Fumio Sakata and Nobuyoshi Yamazaki. These partnerships have fostered innovation and have been instrumental in advancing leakage detection technologies.
Conclusion
Hitoshi Arai's contributions to leakage detection technology exemplify the impact of innovative thinking in engineering. His patented methods not only enhance safety but also pave the way for future advancements in the industry.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile