Takasago, Japan

Hitomi Adachi

This inventor holds 1 USPTO granted patent. Top assignee: Kobe Steel, Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hitomi Adachi. Retrieved from https://idiyas.com/inventor/hitomi-adachi-h2409uz2

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Hitomi Adachi - Innovator in Measurement Systems

Introduction

Hitomi Adachi is a notable inventor based in Takasago, Japan. He has made significant contributions to the field of measurement systems, particularly in the context of metallic structures. His innovative work has led to the development of a unique measurement system that enhances the accuracy of X-ray diffraction measurements.

Latest Patents

Adachi holds 1 patent for his invention titled "Measurement system and measurement method." This patent describes a measurement system that enables the measurement of intensity distribution of diffracted X-rays. The system is designed to irradiate a fillet portion of a metallic structure, which includes an axis portion and a flange portion. The measurement system features a diffracted X-rays measurement device equipped with an irradiation unit and a positioning device that allows for precise positioning and movement of the measurement device.

Career Highlights

Hitomi Adachi is currently employed at Kobe Steel, Ltd., where he continues to innovate and develop advanced measurement technologies. His work is instrumental in improving the quality and reliability of measurements in various engineering applications.

Collaborations

Adachi collaborates with talented colleagues, including Mariko Matsuda and Ryota Yakura. Their combined expertise contributes to the advancement of measurement technologies within their organization.

Conclusion

Hitomi Adachi's contributions to measurement systems exemplify the spirit of innovation in engineering. His patented technology not only enhances measurement accuracy but also showcases the importance of collaboration in achieving groundbreaking advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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