Yokohama, Japan

Hisashi Shiozawa

This inventor holds 3 USPTO granted patents. Top assignee: Nikon Corporation. Active years: 1997-2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hisashi Shiozawa. Retrieved from https://idiyas.com/inventor/hisashi-shiozawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 66.7

Average Co-Inventor Count = 1.8

ph-index = 2

Forward Citations = 11(Granted Patents)


Location History:

  • Yokohama, JP (1997 - 2005)
  • Tokyo, JP (2005)

Company Filing History:


Years Active: 1997-2005

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3 patents (USPTO):Explore Patents

Title: Hisashi Shiozawa: Innovator in Point Diffraction Interferometry

Introduction

Hisashi Shiozawa is a prominent inventor based in Yokohama, Japan. He has made significant contributions to the field of optical measurement, particularly in point diffraction interferometry. With a total of 3 patents to his name, Shiozawa's work has advanced the understanding and application of optical technologies.

Latest Patents

Hisashi Shiozawa's latest patents include a method and apparatus for point diffraction interferometry. This innovative method involves forming a substantially ideal spherical wave using a point light source-generating unit. The light flux, composed of this spherical wave, passes through a test sample and is then divided into two light fluxes using an optical path-dividing element. One of these light fluxes is converted into a reference light beam, which is also a substantially ideal spherical wave. The interference fringes generated from the interaction between the reference light beam and the measuring light beam allow for the measurement of wavefront aberration in the test sample, unaffected by system vibrations.

Another notable patent is a method for measuring interference and an apparatus for measuring interference. In this invention, both the optical distance of the detected-light light path and the reference-light light path are varied simultaneously according to specified patterns. This creates differences in the intensity variations of the required signal component and the coherent noise components. By performing modulation scanning, the phase difference between the detected light and reference light is determined, providing shape information for the detected surface while minimizing the effects of coherent noise.

Career Highlights

Hisashi Shiozawa is associated with Nikon Corporation, a leading company in optical and imaging technology. His work at Nikon has allowed him to push the boundaries of optical measurement techniques, contributing to advancements in various applications.

Collaborations

Shiozawa has collaborated with notable colleagues, including Jun Kawakami and Mikihiko Ishii. These collaborations have fostered innovation and have been instrumental in the development of new optical measurement technologies.

Conclusion

Hisashi Shiozawa's contributions to point diffraction interferometry and optical measurement are significant. His innovative patents and work at Nikon Corporation highlight his role as a leading inventor in the field. His advancements continue to influence the optical technology landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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