Tokyo, Japan

Hisashi Oosawa

This inventor holds 5 USPTO granted patents and 3 EPO patents. Top assignee: Kabushiki Kaisha Toshiba. Active years: 2013-2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hisashi Oosawa. Retrieved from https://idiyas.com/inventor/hisashi-oosawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 80.0

 

Average Co-Inventor Count = 2.5

ph-index = 2

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2013-2018

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5 patents (USPTO):Explore Patents

Title: Hisashi Oosawa: Innovator in Sheet Processing Technology

Introduction

Hisashi Oosawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of sheet processing technology. With a total of 5 patents to his name, Oosawa has established himself as a key figure in innovation.

Latest Patents

Hisashi Oosawa's latest patents include a sheet processing system and a sheet processing method. These innovations are designed to enhance the efficiency and effectiveness of sheet processing operations. His work in this area reflects his commitment to advancing technology in practical applications.

Career Highlights

Oosawa is currently employed at Toshiba Corporation, a leading company in technology and electronics. His role at Toshiba has allowed him to work on cutting-edge projects that push the boundaries of what is possible in sheet processing.

Collaborations

Throughout his career, Oosawa has collaborated with notable colleagues, including Yoshitaka Sakoguchi and Kazuhiro Mukai. These partnerships have contributed to the development of innovative solutions in their field.

Conclusion

Hisashi Oosawa's contributions to sheet processing technology highlight his role as an influential inventor. His work continues to impact the industry positively, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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