logo

For the Inventor, By the Inventor

Yamanashi, Japan

Hisashi Koike

This inventor holds 5 USPTO granted patents. Top assignee: Tokyo Electron Limited. Active years: 1990-1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hisashi Koike. Retrieved from https://idiyas.com/inventor/hisashi-koike-1ikeifcb

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 5

% Patents Active = 100.0

Average Co-Inventor Count = 2.8

ph-index = 4

Forward Citations = 48(Granted Patents)


Company Filing History:

goldMedal5 out of 10,918 
 
Tokyo Electron Limited
 patents

Years Active: 1990-1992

Loading Chart...
5 patents (USPTO):Explore Patents
1. 5091694 - Quartz probe apparatus (1992-02-25),
2. 5086270 - Probe apparatus (1992-02-04),
3. 4950982 - Electric probing test machine (1990-08-21),
4. 4941800 - Transfer apparatus for plate-like member (1990-07-17),
5. 4901011 - Carrier for transferring plate-like objects one by one, a handling (1990-02-13),

Title: Hisashi Koike: Innovator in Quartz Probe Technology

Introduction

Hisashi Koike is a prominent inventor based in Yamanashi, Japan. He has made significant contributions to the field of quartz probe technology, holding a total of 5 patents. His work has advanced the capabilities of measuring and examining various objects with precision.

Latest Patents

One of Hisashi Koike's latest inventions is a quartz probe apparatus. This apparatus features multiple quartz probe bodies, each equipped with a metal pattern layer. The design includes a microprobe portion that integrates several microprobes corresponding to electrode arrays of the object being examined. Additionally, the apparatus has a pattern wiring portion connected to the microprobe portion and an electrode pad portion linked to the pattern wiring. The quartz probe bodies are created by etching a Z-plane of a quartz plate, which is perpendicular to the crystal axis Z. Another notable invention is a probe apparatus that consists of a measuring section with a first system for electrically measuring an object. This apparatus also includes a loader section with a second system for transporting objects to the measuring section and a marking section with a third system for marking objects. Each section operates independently, ensuring that vibrations in one section do not affect the others.

Career Highlights

Hisashi Koike is currently employed at Tokyo Electron Limited, a leading company in the semiconductor and electronics industry. His role involves developing innovative technologies that enhance measurement and examination processes.

Collaborations

Throughout his career, Koike has collaborated with notable colleagues, including Sumi Tanaka and Tadashi Obikane. These partnerships have contributed to the advancement of his research and inventions.

Conclusion

Hisashi Koike's contributions to quartz probe technology exemplify his innovative spirit and dedication to advancing measurement techniques. His work continues to influence the field and inspire future developments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…