Ishikawa, Japan

Hisamitsu Kamenaga

This inventor holds 1 USPTO granted patent. Top assignee: Murata Manufacturing Co., Ltd.. Active years: 2004.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hisamitsu Kamenaga. Retrieved from https://idiyas.com/inventor/hisamitsu-kamenaga

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2004

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1 patent (USPTO):Explore Patents

Title: Hisamitsu Kamenaga: Innovator in Wire Bonding Technology

Introduction

Hisamitsu Kamenaga is a notable inventor based in Ishikawa, Japan. He has made significant contributions to the field of wire bonding technology, particularly through his innovative methods that enhance the reliability and efficiency of electronic connections.

Latest Patents

Kamenaga holds a patent for a wire bonding method that involves ultrasonically joining two connecting electrodes with a wire. This method includes the formation of at least one of the connecting electrodes with tantalum and utilizes a wire that has a fracture load of about 21 g or greater, or a fracture stress of 290 N/mm or greater. This innovation is crucial for improving the performance of electronic devices.

Career Highlights

Hisamitsu Kamenaga is associated with Murata Manufacturing Co., Ltd., a leading company in the electronics industry. His work at Murata has allowed him to focus on advancing technologies that are essential for modern electronic applications.

Collaborations

Kamenaga has collaborated with notable colleagues such as Norihiko Takada and Shingo Iwasa. Their combined expertise has contributed to the development of cutting-edge technologies in the field.

Conclusion

Hisamitsu Kamenaga's contributions to wire bonding technology exemplify the importance of innovation in the electronics industry. His work continues to influence advancements in electronic device manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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