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Yokohama, Japan

Hisako Aoyama

USPTO Granted Patents = 7

Average Co-Inventor Count = 4.0

ph-index = 4

Forward Citations = 120(Granted Patents)

Location History:

Kawasaki, JP (1997 - 2004)
Kanagawa, JP (2006)
Yokohama, JP (2000 - 2012)

Company Filing History:

7 out of 52,711

Kabushiki Kaisha Toshiba

Years Active: 1997-2012

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7 patents (USPTO):Sort by Forward Citations

Abstract keywords

1. 8097169 - Method for filtering chemical (2012-01-17),

2. 7862965 - Method for detecting defects which originate from chemical solution and method of manufacturing semiconductor device (2011-01-04),

3. 7075098 - Method of selecting pattern to be measured, pattern inspection method, manufacturing method of semiconductor device, program, and pattern inspection apparatus (2006-07-11),

4. 6794286 - Process for fabricating a metal wiring and metal contact in a semicondutor device (2004-09-21),

5. 6090699 - Method of making a semiconductor device (2000-07-18),

6. 6060368 - Mask pattern correction method (2000-05-09),

7. 5592024 - Semiconductor device having a wiring layer with a barrier layer (1997-01-07),

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