Yokohama, Japan

Hisaaki Nakajima

This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Corporation. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hisaaki Nakajima. Retrieved from https://idiyas.com/inventor/hisaaki-nakajima

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Hisaaki Nakajima: Innovator in Data Extraction Technology

Introduction

Hisaaki Nakajima is a prominent inventor based in Yokohama, Japan. He is known for his innovative contributions to data extraction methods and devices. His work has significantly impacted the field of data processing and management.

Latest Patents

Hisaaki Nakajima holds a patent for a data extraction method and device. This method involves obtaining a log that contains control messages for multiple calls. It executes several extraction processes in parallel, each designed to extract a control message for a different call from the log. The process includes determining whether a candidate message is a paging message and storing order information to specify the call's order among the plurality of calls.

Career Highlights

Hisaaki Nakajima is currently employed at Fujitsu Corporation, a leading technology company. His role involves developing advanced data extraction technologies that enhance the efficiency of data management systems. His innovative approach has led to significant advancements in the field.

Collaborations

Hisaaki has collaborated with notable colleagues, including Hironobu Kurumazaki and Tomohisa Satou. These collaborations have fostered a creative environment that encourages the development of cutting-edge technologies.

Conclusion

Hisaaki Nakajima's contributions to data extraction technology exemplify his innovative spirit and dedication to advancing the field. His work continues to influence the way data is processed and managed in various applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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