Atsugi, Japan

Hiroyunki Hanai

This inventor holds 1 USPTO granted patent. Top assignee: Mitsumi Electric Company Ltd.. Active years: 2001.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyunki Hanai. Retrieved from https://idiyas.com/inventor/hiroyunki-hanai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2001

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1 patent (USPTO):Explore Patents

Title: Hiroyunki Hanai and His Dust-Proof Disk Apparatus Patent.

Introduction

Hiroyunki Hanai is an inventor associated with Atsugi, Japan, and Mitsumi Electric Company Ltd. His recorded patent concerns a disk apparatus designed to protect its optical head from external dust.

Latest Patents

The available information lists one patent for Hanai: “Disk apparatus having a dust proof construction.” The invention places the optical head inside an enclosed space formed by a box-like chassis and the apparatus case. The optical head reads information recorded on a disk, while a circuit board assembly that processes information from the head is positioned outside the chassis. The chassis walls have contacting surfaces that meet the case, helping create the enclosure and shield the optical head from dust. Hanai is credited with 1 patent.

Career Highlights

Hanai’s listed patent reflects work on protecting sensitive optical components within disk apparatus. The record associates him with Mitsumi Electric Company Ltd.

Collaborations

Mitsunori Nakamura and Tsutomu Uchino are identified as Hanai’s coworkers.

Conclusion

Hiroyunki Hanai’s recorded invention focuses on a practical dust-protection design for disk apparatus, enclosing the optical head while locating the circuit board assembly outside that protected space.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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