Kanazawa, Japan

Hiroyuki Yamashina

This inventor holds 3 USPTO granted patents. Top assignee: Pfu Limited. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyuki Yamashina. Retrieved from https://idiyas.com/inventor/hiroyuki-yamashina

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 3

Forward Citations = 133(Granted Patents)


Company Filing History:


Years Active: 2012

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3 patents (USPTO):Explore Patents

Title: Hiroyuki Yamashina: Innovator in Touch Panel Technology

Introduction

Hiroyuki Yamashina is a notable inventor based in Kanazawa, Japan. He has made significant contributions to the field of touch panel technology, holding a total of 3 patents. His work has been instrumental in advancing user interface design, particularly in scanner technology.

Latest Patents

Among his latest innovations is a touch panel for scanners that features a graphical user interface. This invention enhances the user experience by providing intuitive controls and improved functionality. The focus on user-friendly design reflects Yamashina's commitment to innovation in technology.

Career Highlights

Hiroyuki Yamashina is currently employed at PFU Limited, a company known for its advanced technology solutions. His role at PFU Limited allows him to further develop his ideas and contribute to the company's mission of delivering high-quality products.

Collaborations

Yamashina has collaborated with Kiichi Taniho, a fellow innovator, to enhance the development of touch panel technologies. Their partnership exemplifies the collaborative spirit that drives innovation in the tech industry.

Conclusion

Hiroyuki Yamashina's contributions to touch panel technology demonstrate his expertise and dedication to innovation. His work continues to influence the design and functionality of user interfaces in modern technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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