Shizuoka, Japan

Hiroyuki Oohara

This inventor holds 1 USPTO granted patent. Top assignee: Fujifilm Corporation. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyuki Oohara. Retrieved from https://idiyas.com/inventor/hiroyuki-oohara

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: Hiroyuki Oohara: Innovator in Cutting Technology

Introduction

Hiroyuki Oohara is a notable inventor based in Shizuoka, Japan. He has made significant contributions to the field of cutting technology, particularly with his innovative designs that enhance efficiency and precision.

Latest Patents

Oohara holds a patent for a guillotine cutter and tape affixing apparatus. This invention features a fixed blade and a movable blade that moves back and forth along a straight line while maintaining contact with the fixed blade. The design allows for the effective cutting of tape-shaped objects in a widthwise direction. Notably, both blades are equipped with a recess portion, which is a concave area wider than the object being cut, ensuring a clean and precise cut.

Career Highlights

Hiroyuki Oohara is currently employed at Fujifilm Corporation, where he continues to innovate and develop new technologies. His work has been instrumental in advancing the capabilities of cutting tools used in various applications.

Collaborations

Oohara collaborates with Noriaki Uneyama, contributing to the development of cutting-edge technologies within their field.

Conclusion

Hiroyuki Oohara's contributions to cutting technology through his innovative patents and work at Fujifilm Corporation highlight his importance as an inventor. His advancements continue to influence the industry and improve efficiency in cutting applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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