This inventor holds 3 USPTO granted patents and 1 published patent application. Top assignee: Horiba, Ltd.. Active years: 1995-2007.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Location History:
- Miyanohigashi, JP (1995)
- Kyoto, JP (2006 - 2007)
Company Filing History:
Years Active: 1995-2007
Title: Innovations of Hiroyuki Kitamura
Introduction
Hiroyuki Kitamura is a notable inventor based in Kyoto, Japan. He has made significant contributions to the field of particle size analysis, holding three patents that showcase his innovative approach to technology. His work primarily focuses on developing advanced systems for measuring and analyzing particle size distribution.
Latest Patents
One of his latest patents is a particle size distribution analyzer. This invention includes a data processing system that integrates light intensity signals from detectors measuring scattered and transmitted light. The system outputs integrated values and generates control signals for a vibration actuator, which helps in dropping the sample powder to achieve a desired light intensity. Another significant patent is for a sample supplying device for a dry particle-size distribution measuring apparatus. This device features bristle members that contact and disperse clusters of particles before they are released into a sample flow cell. A light source irradiates the sample, and a detector unit measures the scattered light to determine particle size and distribution.
Career Highlights
Hiroyuki Kitamura is associated with Horiba, Ltd., a company renowned for its analytical and measuring instruments. His work at Horiba has been instrumental in advancing technologies related to particle size measurement.
Collaborations
He has collaborated with notable coworkers, including Yoshiaki Togawa and Juichiro Ukon, contributing to the development of innovative solutions in his field.
Conclusion
Hiroyuki Kitamura's contributions to particle size analysis through his patents reflect his dedication to innovation and technology. His work continues to influence the industry and enhance measurement techniques.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
