Ypsilanti, MI, United States of America

Hiroyuki Imai

This inventor holds 2 USPTO granted patents. Top assignee: Toyota Jidosha Kabushiki Kaisha. Active years: 2022-2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyuki Imai. Retrieved from https://idiyas.com/inventor/hiroyuki-imai-f2dedg86

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.4

ph-index = 2

Forward Citations = 28(Granted Patents)


Company Filing History:


Years Active: 2022-2025

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2 patents (USPTO):Explore Patents

Title: Hiroyuki Imai: Innovator in Automotive Instrumentation

Introduction

Hiroyuki Imai is a notable inventor based in Ypsilanti, MI (US). He has made significant contributions to the field of automotive instrumentation, holding a total of 2 patents. His work primarily focuses on enhancing the functionality and design of instrument panels in vehicles.

Latest Patents

Hiroyuki Imai's latest patents include innovative designs for an instrument panel for an automobile and an instrument panel for a motor vehicle. These patents reflect his commitment to improving user experience and safety in automotive design.

Career Highlights

Imai is currently employed at Toyota Jidosha Kabushiki Kaisha, a leading company in the automotive industry. His role involves developing cutting-edge technologies that contribute to the advancement of vehicle instrumentation.

Collaborations

Throughout his career, Hiroyuki has collaborated with talented individuals such as Benjamin David Jimenez and Kwang Ha Kim. These partnerships have fostered a creative environment that encourages innovation and excellence in automotive design.

Conclusion

Hiroyuki Imai's contributions to automotive instrumentation through his patents and collaborations highlight his role as a key innovator in the industry. His work continues to influence the future of vehicle design and functionality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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