Tokyo, Japan

Hiroyuki Frusho

This inventor holds 2 USPTO granted patents. Top assignee: Kabushiki Kaisha Topcon. Active years: 1990.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyuki Frusho. Retrieved from https://idiyas.com/inventor/hiroyuki-frusho

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.4

ph-index = 2

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1990

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2 patents (USPTO):Explore Patents

Title: Hiroyuki Frusho: Inventor in Image Technology

Introduction

Hiroyuki Frusho is an inventor based in Tokyo, Japan, associated with Kabushiki Kaisha Topcon. His recorded work includes inventions in stereoscopic image display and image input technology. He holds 2 patents.

Latest Patents

Frusho’s listed patents include “Stereoscopic Image Display Apparatus,” which describes displaying left and right images on separate monitors to create a stereoscopic view. The apparatus stores image information, transforms the coordinate systems for the left and right images, and displays the transformed images on their respective monitors.

His other listed patent, “Image Input Apparatus,” describes an image sensor with a two-dimensional photosensitive surface. The sensor converts image segments into digital information in a predetermined sequence.

Career Highlights

Frusho’s patent work reflects an interest in systems for capturing and presenting visual information. His inventions address both the processing of image segments and the display of stereoscopic images.

Collaborations

Frusho’s listed coworkers include Fumio Ohtomo and Shinichi Nakamura. His work is associated with Kabushiki Kaisha Topcon.

Conclusion

Hiroyuki Frusho’s recorded inventions focus on image input and stereoscopic display, contributing to the development of visual imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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