Nagoya, Japan

Hiroyoshi Inoue

This inventor holds 1 USPTO granted patent. Top assignee: Ngk Insulators, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroyoshi Inoue. Retrieved from https://idiyas.com/inventor/hiroyoshi-inoue-u20aqznf

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hiroyoshi Inoue: Inventor of a Honeycomb Filter Inspection Device

Introduction

Hiroyoshi Inoue is an inventor associated with Nagoya, Japan, and NGK Insulators, Ltd. His recorded patent work concerns inspection technology for pillar-shaped honeycomb filters. The supplied information lists 1 patent.

Latest Patents

Inoue’s listed invention is “Generated Particle Inspection Device and Inspection Method Thereof for Pillar-Shaped Honeycomb Filter.” The device introduces generated particles into a honeycomb filter inspection system and uses particle counters to measure their number. Its components include a housing, introduction and discharge pipes, a particle-generation portion, and a particle-introduction portion. A gas-stirring portion and a particle-concentration-adjusting portion are positioned along the introduction pipe to support the inspection process.

Career Highlights

Inoue’s patent record highlights work on equipment for inspecting pillar-shaped honeycomb filters. The invention combines particle generation, controlled particle introduction, gas stirring, concentration adjustment, and particle counting in a single inspection arrangement.

Collaborations

The supplied information identifies Takakazu Koyama and Yuji Watanabe as Inoue’s coworkers. They are also associated with the listed patent.

Conclusion

Hiroyoshi Inoue’s recorded invention focuses on particle-based inspection of pillar-shaped honeycomb filters, reflecting his patent work connected with NGK Insulators, Ltd.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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