Gifu, Japan

Hirotoshi Ishikawa

This inventor holds 2 USPTO granted patents. Top assignee: Shachihata Inc.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirotoshi Ishikawa. Retrieved from https://idiyas.com/inventor/hirotoshi-ishikawa-c85zw9t3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2011

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2 patents (USPTO):Explore Patents

Title: Innovations of Hirotoshi Ishikawa

Introduction

Hirotoshi Ishikawa is a notable inventor based in Gifu, Japan. He has made significant contributions to the field of printing technology, holding two patents that showcase his innovative spirit and technical expertise.

Latest Patents

Ishikawa's latest patents include the "Endless Print Belt for Rotary Stamp" and the "Rotary Stamp with Master Stamp." The Endless Print Belt features a design where multiple print sections are spaced apart on a porous material surface, with grooves to prevent ink leakage. The Rotary Stamp incorporates a master stamp with an oblong hole, allowing a specific print section to be exposed while utilizing a specially processed laminated belt that maintains both porous and non-porous states.

Career Highlights

Ishikawa is currently employed at Shachihata Inc., a company known for its innovative stamping solutions. His work has significantly advanced the functionality and efficiency of rotary stamps, making them more user-friendly and effective in various applications.

Collaborations

Throughout his career, Ishikawa has collaborated with talented coworkers such as Hirofumi Kondo and Shogo Ichise. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies in the printing industry.

Conclusion

Hirotoshi Ishikawa's contributions to printing technology through his patents and collaborations highlight his role as

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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