Hitachi, Japan

Hiroto Nakai

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Hitachi Information & Control Solutions, Ltd.. Active years: 2008-2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroto Nakai. Retrieved from https://idiyas.com/inventor/hiroto-nakai-6oig72qq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 2 

% Patents Active = 100.0

Average Co-Inventor Count = 4.4

ph-index = 2

Forward Citations = 15(Granted Patents)


Company Filing History:


Years Active: 2008-2009

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2 patents (USPTO):Explore Patents

Title: Hiroto Nakai: Innovator in Biometrics Technology

Introduction

Hiroto Nakai is a prominent inventor based in Hitachi, Japan. He has made significant contributions to the field of biometrics, holding a total of 2 patents. His work focuses on developing advanced technologies that enhance security and user experience.

Latest Patents

One of Hiroto Nakai's latest innovations is the biometrics input unit. This technology aims to improve the accuracy and efficiency of biometric data collection, which is essential for various applications in security and personal identification.

Career Highlights

Hiroto Nakai is currently employed at Hitachi Information & Control Solutions, Ltd. His role at the company allows him to work on cutting-edge technologies that push the boundaries of what is possible in the field of biometrics.

Collaborations

Throughout his career, Hiroto has collaborated with notable colleagues, including Hiroyuki Noda and Kichiro Kikuchi. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Hiroto Nakai's contributions to biometrics technology exemplify his dedication to innovation. His work continues to influence the industry and pave the way for future advancements in security technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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