Osaka, Japan

Hirotaro Mori

This inventor holds 1 USPTO granted patent. Top assignee: Matsushita Electric Industrial Co., Ltd.. Active years: 2006.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirotaro Mori. Retrieved from https://idiyas.com/inventor/hirotaro-mori-56cllpag

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2006

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1 patent (USPTO):Explore Patents

Title: Hirotaro Mori: Inventor in Electron Microscopy

Introduction

Hirotaro Mori is an inventor associated with Osaka, Japan, and Matsushita Electric Industrial Co., Ltd. His patent work concerns observing defects in amorphous materials using transmission electron microscopy.

Latest Patents

Mori is credited with 1 patent: “Method of Observation by Transmission Electron Microscopy.” The method directs an electron beam into an amorphous material, eliminates the resulting diffraction wave so that the image is formed only by the transmitted wave, and observes the image under an under-focus condition.

Career Highlights

Mori’s listed invention applies transmission electron microscopy to the observation of defects in amorphous materials. His company affiliation is Matsushita Electric Industrial Co., Ltd.

Collaborations

Mori’s listed coworkers include Shinichi Ogawa and Junichi Shimanuki.

Conclusion

Hirotaro Mori’s patent describes a microscopy method designed to make defects in amorphous materials observable by isolating the transmitted electron wave and using under-focus imaging.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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