This inventor holds 1 USPTO granted patent and 20 published patent applications. Top assignee: Ricoh Company, Ltd.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Hirotaka Yasukawa: Innovator in Thickness Detection Technology
Introduction
Hirotaka Yasukawa is a notable inventor based in Kanagawa, Japan. He has made significant contributions to the field of thickness detection technology. His innovative work has led to the development of a unique device that enhances the accuracy of thickness measurements in various applications.
Latest Patents
Yasukawa holds a patent for a "Thickness detection device, sheet processing apparatus, and image forming system." This device is designed to detect the thickness of an object using a thickness-direction moving member and a thickness detector. The moving member is capable of moving in the thickness direction, allowing it to accurately measure the thickness of objects inserted into a specially designed cavity. The thickness detector then detects the movement of the member to determine the object's thickness. This invention showcases Yasukawa's expertise in creating advanced measurement technologies.
Career Highlights
Hirotaka Yasukawa is currently employed at Ricoh Company, Ltd., where he continues to innovate and develop new technologies. His work at Ricoh has allowed him to collaborate with other talented professionals in the field, further enhancing his contributions to technology.
Collaborations
Some of Yasukawa's coworkers include Atsushi Shinoda and Yuusuke Shibasaki. Their collaborative efforts have likely played a role in advancing the projects they work on together.
Conclusion
Hirotaka Yasukawa is a distinguished inventor whose work in thickness detection technology has made a significant impact. His patent reflects his innovative spirit and dedication to improving measurement accuracy in various applications.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
