Hiroshi Nishihama

Title: Innovations in Charged Particle Beam Technology by Hiroshi Nishihama

Introduction

Hiroshi Nishihama, an esteemed inventor based in Tokyo, Japan, has made significant contributions to the field of charged particle beam technology. With a total of three patents to his name, Nishihama's work centers on enhancing imaging techniques and improving the efficiency of data processing in scientific and industrial applications.

Latest Patents

Nishihama's latest innovations include two pivotal patents related to charged particle beam devices. The first patent, titled "Charged Particle Beam Device," addresses the need to shorten the time required for recipe evaluation while minimizing data overload. This innovative device features a microscope that scans a charged particle beam across a sample, detects secondary particles, and outputs detection signals. It utilizes a computer system to generate frame images and processes these images by calculating a moment image from multiple frames, ultimately extracting feature data based on these calculations.

The second patent, "Charged Particle Beam Apparatus," provides solutions to achieve high-resolution imaging of specific inspection target patterns while controlling beam irradiation. This device improves efficiency by adjusting the movement of the field of view, allowing it to count the number of objects in an initial image and generating a second image based on a more intense scanning process, when necessary.

Career Highlights

Hiroshi Nishihama has built his career at notable institutions, including Hitachi High-Tech Corporation and Hitachi High-Technologies Corporation. His experience in these organizations has facilitated his innovative approach to charged particle beam technology.

Collaborations

Throughout his career, Nishihama has collaborated with prominent professionals such as Shahedul Hoque and Shinya Ueno. These partnerships have likely contributed to the development and refinement of his patents, fostering advancements in the field.

Conclusion

Hiroshi Nishihama's contributions to charged particle beam technology illustrate a profound commitment to innovation and improvement in imaging methods. His patents not only reflect his ingenuity but also serve as significant advancements in the scientific and industrial communities. As technology continues to evolve, Nishihama's work will undoubtedly play a crucial role in shaping future developments in charged particle beam applications.