Kanagawa, Japan

Hiroshi Nakayama

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Nhk Spring, Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Nakayama. Retrieved from https://idiyas.com/inventor/hiroshi-nakayama-o8v8geqa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hiroshi Nakayama: Measurement Technology Inventor

Introduction

Hiroshi Nakayama is an inventor associated with Kanagawa, Japan, and Nhk Spring, Ltd. His work includes a patented measurement-unit design that brings signal and grounding contacts together in a compact structure.

Latest Patents

Nakayama is credited with 1 patent. His patent, “Measurement unit,” describes a unit with separate signal and ground portions, an insulating dielectric between them, and two conductive contact probes that expand and contract along their longitudinal axes. One probe contacts the signal portion, while the other contacts the ground portion. The design aligns the signal and ground ends on the same plane, supporting electrical connections for measurement.

Career Highlights

The available information associates Nakayama’s invention with Nhk Spring, Ltd. The patent’s focus on probe contacts and aligned signal and ground portions reflects an engineering approach to measurement connections.

Collaborations

Tsuyoshi Inuma and Shuji Takahashi are identified as Nakayama’s coworkers. The provided information does not specify their roles in the patent.

Conclusion

Hiroshi Nakayama’s recorded patent presents a measurement-unit design that integrates signal and grounding contacts with expandable probes, highlighting his contribution to measurement technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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