Numazu, Japan

Hiroshi Muramatsu

This inventor holds 1 USPTO granted patent. Top assignee: Fujitsu Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Muramatsu. Retrieved from https://idiyas.com/inventor/hiroshi-muramatsu-h0ple2ch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Innovations of Hiroshi Muramatsu

Introduction

Hiroshi Muramatsu is a notable inventor based in Numazu, Japan. He has made significant contributions to the field of observation systems, showcasing his expertise through his innovative patent.

Latest Patents

Hiroshi Muramatsu holds a patent for an observation system and observation method. This system includes a first sensor designed to observe a first portion of an observation target and a second sensor for observing a second portion. The control device, which comprises a memory and a processor, is configured to receive observation data from both sensors through relay devices. Notably, the system ensures that observation data is not transmitted between sensors when it is being sent to the control device, enhancing the efficiency of data collection.

Career Highlights

Hiroshi is currently employed at Fujitsu Corporation, where he continues to develop innovative technologies. His work at Fujitsu has allowed him to apply his inventive skills in a corporate environment, contributing to advancements in technology.

Collaborations

Hiroshi has collaborated with notable colleagues, including Koichi Takaba and Masato Fushimi. These collaborations have fostered a creative environment that encourages innovation and the development of new ideas.

Conclusion

Hiroshi Muramatsu's contributions to the field of observation systems exemplify his innovative spirit and dedication to advancing technology. His patent reflects a significant step forward in observation methods, showcasing the potential for future developments in this area.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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