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For the Inventor, By the Inventor

Yokohama, Japan

Hiroshi Makihira

This inventor holds 18 USPTO granted patents. Top assignees: Hitachi, Ltd., Japan Nuclear Fuel Co., Ltd.. Active years: 1980-2007.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Makihira. Retrieved from https://idiyas.com/inventor/hiroshi-makihira

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 18

% Patents Active = 94.4

Average Co-Inventor Count = 4.3

ph-index = 15

Forward Citations = 561(Granted Patents)


Location History:

  • Fujisawa, JP (1988)
  • Kanagawa, JP (1992)
  • Yokohama, JP (1980 - 2007)

Company Filing History:

goldMedal18 out of 42,726 
 
Hitachi, Ltd.
 patents
silverMedal2 out of 5 
 
Japan Nuclear Fuel Co., Ltd.
 patents
where one patent can have more than one assignee

Years Active: 1980-2007

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18 patents (USPTO):Explore Patents
1. 7221486 - Method and apparatus for picking up 2D image of an object to be sensed (2007-05-22),
2. 6674890 - Defect inspection method and apparatus therefor (2004-01-06),
3. 6507417 - Method and apparatus for picking up 2D image of an object to be sensed (2003-01-14),
4. 6317512 - Pattern checking method and checking apparatus (2001-11-13),
5. 6169282 - Defect inspection method and apparatus therefor (2001-01-02),
6. 5649022 - Pattern checking method and checking apparatus (1997-07-15),
7. 5430548 - Method and apparatus for pattern detection (1995-07-04),
8. 5153444 - Method and apparatus for detecting patterns (1992-10-06),
9. 4791586 - Method of and apparatus for checking geometry of multi-layer patterns (1988-12-13),
10. 4725722 - Automatic focusing method and apparatus utilizing contrasts of projected (1988-02-16),
11. 4614430 - Method of detecting pattern defect and its apparatus (1986-09-30),
12. 4556797 - Method and apparatus for detecting edge of fine pattern on specimen (1985-12-03),
13. 4472056 - Shape detecting apparatus (1984-09-18),
14. 4410278 - Method and apparatus for appearance inspection (1983-10-18),
15. 4403294 - Surface defect inspection system (1983-09-06),

Title: Hiroshi Makihira - Pioneering Inventor from Yokohama

Introduction: Hiroshi Makihira is a renowned inventor hailing from Yokohama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Hiroshi Makihira holds several patents in the areas of robotics, artificial intelligence, and renewable energy, showcasing his versatility and forward-thinking approach to invention.

Career Highlights: With over two decades of experience in the tech industry, Hiroshi Makihira has worked with leading companies to develop cutting-edge solutions that have revolutionized various sectors.

Collaborations: Throughout his career, Hiroshi Makihira has collaborated with top researchers, engineers, and scientists from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Hiroshi Makihira's passion for pushing the boundaries of technology and his relentless pursuit of innovation continue to inspire the next generation of inventors and entrepreneurs worldwide.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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