Omiya, Japan

Hiroshi Konakawa

This inventor holds 1 USPTO granted patent. Top assignee: Other. Active years: 2002.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Konakawa. Retrieved from https://idiyas.com/inventor/hiroshi-konakawa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:

goldMedal1 out of 834,453 
Other
 patents

Years Active: 2002

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1 patent (USPTO):Explore Patents

Title: Hiroshi Konakawa: Innovator in X-ray Analysis Technology

Introduction

Hiroshi Konakawa is a notable inventor based in Omiya, Japan. He has made significant contributions to the field of X-ray analysis, particularly through his innovative patent that enhances quantitative analysis techniques.

Latest Patents

Konakawa holds a patent for an "X-ray analyzer having an absorption current calculating section." This invention focuses on the quantitative analysis of elements in specimens by measuring absorption current values. The process involves detecting characteristic X-rays generated from a specimen when irradiated with an electron beam. By determining the ratio of absorption current values between the specimen and a reference sample, the invention allows for a more accurate calculation of the irradiation current value, thereby improving the monitoring of the irradiation current.

Career Highlights

Throughout his career, Hiroshi Konakawa has demonstrated a commitment to advancing technology in the field of X-ray analysis. His innovative approach has led to the development of a patented technology that is crucial for precise quantitative analysis in various applications.

Collaborations

Konakawa has worked alongside esteemed colleagues, including Yasuhiko Sato and Seiichi Suzuki. Their collaborative efforts have contributed to the advancement of research and development in their field.

Conclusion

Hiroshi Konakawa's contributions to X-ray analysis technology through his patent reflect his dedication to innovation and excellence. His work continues to influence the field and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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