Hachioji, Japan

Hiroshi Inaba

This inventor holds 1 USPTO granted patent. Top assignee: Janome Sewing Machine Company Limited. Active years: 1982.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Inaba. Retrieved from https://idiyas.com/inventor/hiroshi-inaba-ovg9gy3e

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 1982

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1 patent (USPTO):Explore Patents

Title: Hiroshi Inaba: Innovator in Sewing Technology

Introduction

Hiroshi Inaba is a notable inventor based in Hachioji, Japan. He has made significant contributions to the field of sewing technology, particularly through his innovative patent that enhances the functionality of sewing machines.

Latest Patents

Inaba holds a patent for a "Thread tension control signal output device for sewing machine." This invention provides an electrical indication of improper thread tension, enabling sewing operations to be executed with precision. He has 1 patent to his name, showcasing his expertise in this specialized area.

Career Highlights

Hiroshi Inaba is associated with Janome Sewing Machine Company Limited, a leading manufacturer in the sewing machine industry. His work at Janome has allowed him to focus on developing technologies that improve sewing efficiency and accuracy.

Collaborations

Inaba has collaborated with talented coworkers such as Kenzi Kato and Tamotsu Nakagawa. Their combined efforts contribute to the innovative environment at Janome, fostering advancements in sewing technology.

Conclusion

Hiroshi Inaba's contributions to sewing technology through his patent demonstrate his commitment to innovation in the industry. His work continues to influence the way sewing machines operate, ensuring that users achieve the best results in their sewing projects.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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