Kariya, Japan

Hiroshi Asami

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignee: Denso Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Asami. Retrieved from https://idiyas.com/inventor/hiroshi-asami-v6ygnnpk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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2 patents (USPTO):Explore Patents

Title: Hiroshi Asami: Innovator in Optical Systems and Laser Technology

Introduction

Hiroshi Asami is a prominent inventor based in Kariya, Japan. He has made significant contributions to the fields of imaging optical systems and laser radar technology. With a total of 2 patents, Asami's work showcases his expertise and innovative spirit.

Latest Patents

Asami's latest patents include an imaging optical system and a laser radar device. The imaging optical system features a sequential arrangement of lenses, including a fourth lens with an aspherical concave shape that gradually weakens in negative refractive power from the center to the periphery. The fifth lens is designed with positive refractive power, enhancing the system's overall functionality. The laser radar device comprises a light source, a rotatable mirror, and a detector. The mirror is uniquely designed with a low reflection area to optimize the detection of laser light.

Career Highlights

Hiroshi Asami is currently associated with Denso Corporation, where he applies his innovative skills to develop cutting-edge technologies. His work at Denso has positioned him as a key player in advancing optical and laser technologies.

Conclusion

Hiroshi Asami's contributions to imaging optical systems and laser radar devices reflect his dedication to innovation and technology. His patents not only highlight his inventive capabilities but also contribute to the advancement of these critical fields.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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