Ehime, Japan

Hiroshi Andoh

This inventor holds 1 USPTO granted patent. Top assignee: Panasonic Healthcare Holdings Co., Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroshi Andoh. Retrieved from https://idiyas.com/inventor/hiroshi-andoh-44o8890w

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Hiroshi Andoh: Innovator in Biological Information Measurement

Introduction

Hiroshi Andoh is a notable inventor based in Ehime, Japan. He has made significant contributions to the field of biological information measurement. His work focuses on enhancing the accuracy of measurement devices used in healthcare.

Latest Patents

Hiroshi Andoh holds a patent for a biological information measurement device. This invention aims to suppress variance in measurement results and enhance measurement accuracy. The device comprises a main case with a sensor mounting component, a measurement component, and a controller. The controller operates in a measurement mode, executing operations based on preset timing to ensure the suitability of measurements.

Career Highlights

Hiroshi Andoh is associated with Panasonic Healthcare Holdings Co., Ltd., where he applies his expertise in developing innovative healthcare solutions. His work has contributed to advancements in medical technology, particularly in the accuracy of biological measurements.

Collaborations

Hiroshi collaborates with Yuichi Sugiue, working together to push the boundaries of innovation in their field.

Conclusion

Hiroshi Andoh's contributions to biological information measurement exemplify the importance of innovation in healthcare technology. His patent reflects a commitment to improving measurement accuracy, which is crucial for effective medical diagnostics.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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