Yokohama, Japan

Hironari Someya

This inventor holds 4 USPTO granted patents. Top assignee: Silhouette Japan Corporation. Active years: 2025-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hironari Someya. Retrieved from https://idiyas.com/inventor/hironari-someya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0

Average Co-Inventor Count = 1.5

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2025-2026

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4 patents (USPTO):Explore Patents

Title: Hironari Someya: Innovator in Cutting Technology

Introduction

Hironari Someya is a notable inventor based in Yokohama, Japan. He has made significant contributions to the field of cutting technology, holding a total of 4 patents. His work has been instrumental in advancing the capabilities of cutting plotters.

Latest Patents

Someya's latest patents include a "Rolled Medium Holder for Cutting Plotter" and an innovative "Cutting Plotter." These inventions showcase his commitment to improving the efficiency and functionality of cutting devices.

Career Highlights

Hironari Someya is currently employed at Silhouette Japan Corporation, where he continues to develop cutting-edge technologies. His expertise in the field has positioned him as a key player in the industry.

Collaborations

Someya collaborates with his coworker, Mayumi Sato, to enhance the innovative processes at Silhouette Japan Corporation. Their teamwork fosters a creative environment that drives technological advancements.

Conclusion

Hironari Someya's contributions to cutting technology through his patents and work at Silhouette Japan Corporation highlight his role as an influential inventor. His ongoing efforts continue to shape the future of cutting plotters and related technologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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