Company Filing History:
3 out of 1,134 
2 out of 389 
Years Active: 2022-2025
Title: Hiromichi Yamakawa: Innovator in Defect Inspection Technology
Introduction
Hiromichi Yamakawa is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of defect inspection technology, holding a total of five patents. His innovative work focuses on enhancing the accuracy and efficiency of defect detection in various applications.
Latest Patents
Yamakawa's latest patents include a defect inspection device that features an inclined optical axis of a detection optical system. This device calculates the height variation of an illumination spot based on outputs from a height measuring unit. Additionally, it controls a focus actuator to ensure precise defect detection. Another notable patent is a defect inspection apparatus that utilizes a linear illumination spot and a condensing detection unit to improve light incident efficiency. This apparatus is designed to output high-quality optical images for effective defect analysis.
Career Highlights
Throughout his career, Yamakawa has worked with esteemed companies such as Hitachi High-Tech Corporation and Hitachi LG Data Storage, Inc. His experience in these organizations has allowed him to develop and refine his innovative technologies in defect inspection.
Collaborations
Yamakawa has collaborated with notable colleagues, including Yuta Urano and Eiji Arima. These partnerships have contributed to the advancement of his research and the successful development of his patented technologies.
Conclusion
Hiromichi Yamakawa's contributions to defect inspection technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of optical systems and their applications in quality control. His work continues to influence the field and inspire future advancements.