Tokyo, Japan

Hiromi Okitsu

This inventor holds 1 USPTO granted patent. Top assignee: Sony Corporation. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiromi Okitsu. Retrieved from https://idiyas.com/inventor/hiromi-okitsu-4rrpbw3e

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 24(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Hiromi Okitsu: Innovator in Surveillance Technology

Introduction

Hiromi Okitsu is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of surveillance technology. His innovative approach has led to the development of a unique surveillance system that incorporates advanced features.

Latest Patents

Okitsu holds a patent for a surveillance system that includes self-test functions. This system features an image pick-up sensor and an image processing unit that detects scene changes in video signals. Additionally, it has an alarm generator that produces alarm signals based on the detection of these changes. A self-tester is also included, which superimposes noise signals on the video signals to provide quasi-scene change information.

Career Highlights

Hiromi Okitsu is currently employed at Sony Corporation, a leading technology company known for its innovative products. His work at Sony has allowed him to explore and develop cutting-edge technologies in the surveillance domain.

Collaborations

Okitsu collaborates with Susumu Tagawa, a talented woman in the field. Their partnership has fostered creativity and innovation in their projects.

Conclusion

Hiromi Okitsu's contributions to surveillance technology exemplify the spirit of innovation. His patent and work at Sony Corporation highlight his commitment to advancing technology in meaningful ways.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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