Location History:
- Saitama, JP (1991)
- Ina-machi, JP (1996)
Company Filing History:
Years Active: 1991-1996
Title: Hiromi Ohshima: Innovator in Flash Memory Testing Technology
Introduction
Hiromi Ohshima is a notable inventor based in Saitama, Japan. He has made significant contributions to the field of memory testing technology, holding two patents that enhance the efficiency and accuracy of flash memory testing.
Latest Patents
Ohshima's latest patents include a flash memory testing apparatus and a memory tester. The flash memory testing apparatus is designed to test flash memory while maintaining conventional memory test functions. It effectively counts the number of programming pulses applied to each address of the flash memory. The apparatus compares readout data from the flash memory under test with expected data from a test pattern generator. If the readout data does not match the expected data, a failure signal is outputted to a failure analysis memory, storing the failure data. Conversely, a pass signal is generated when the readout data coincides with the expected data. The system also includes a counter for tracking programming or erasing pulses, supplying this count data to the failure analysis memory.
The memory tester operates by comparing data read from a memory address with an expected value. The results of this comparison are written into a failure analysis memory at the corresponding address. An address pointer, which increments or decrements with each clock application, selectively applies output addresses to the failure analysis memory. A cycle delay circuit is incorporated to synchronize the address provided from the pattern generator with the clock cycles, ensuring accurate data comparison.
Career Highlights
Hiromi Ohshima is currently employed at Adv Antest Corporation, where he continues to innovate in the field of memory testing technology. His work has significantly impacted the efficiency of memory testing processes, making them more reliable and effective.
Collaborations
Ohshima collaborates with talented coworkers, including Shinya Sato and Junji Nishiura, contributing to advancements in their field through teamwork and shared expertise.
Conclusion
Hiromi Ohshima's contributions to flash memory testing technology exemplify his innovative spirit and dedication to improving memory testing processes. His patents reflect a commitment to enhancing the reliability and efficiency of technology in this critical area.