Tenri, Japan

Hiromi Abe

This inventor holds 1 USPTO granted patent. Top assignee: Sharp Kabushiki Kaisha Corporation. Active years: 1995.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiromi Abe. Retrieved from https://idiyas.com/inventor/hiromi-abe-wcf9ey7v

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1995

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Hiromi Abe: Innovator in Position Detection Technology

Introduction

Hiromi Abe is a notable inventor based in Tenri, Japan. She has made significant contributions to the field of position detection technology. Her innovative approach has led to the development of a unique apparatus that enhances detection capabilities while reducing costs.

Latest Patents

Hiromi Abe holds a patent for a position detecting apparatus. This apparatus is designed with a detecting face that can identify the positions of specified points. It achieves a high level of detection resolution in certain regions without requiring a finer resolution across the entire detection face. This innovation allows for advanced manufacturing techniques to be employed at a lower cost.

Career Highlights

Hiromi Abe is associated with Sharp Kabushiki Kaisha Corporation, where she has been able to apply her expertise in developing cutting-edge technologies. Her work has been instrumental in advancing the capabilities of position detection systems.

Collaborations

Throughout her career, Hiromi has collaborated with esteemed colleagues such as Yasuji Obuchi and Toshiyuki Okunishi. These partnerships have fostered a creative environment that encourages innovation and the sharing of ideas.

Conclusion

Hiromi Abe's contributions to position detection technology exemplify her commitment to innovation and excellence. Her work not only enhances detection capabilities but also makes advanced technology more accessible and cost-effective.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…