Kimino-cho, Japan

Hiroki Wada

This inventor holds 1 USPTO granted patent. Top assignee: Hotani Co., Ltd.. Active years: 2019.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroki Wada. Retrieved from https://idiyas.com/inventor/hiroki-wada-r0qzj9c3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2019

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1 patent (USPTO):Explore Patents

Title: Hiroki Wada: Innovator in Brush Technology

Introduction

Hiroki Wada is a notable inventor based in Kimino-cho, Japan. He has made significant contributions to the field of brush technology, particularly in the design of bristle elements for brushes and brush rolls. His innovative approach aims to enhance the efficiency and effectiveness of industrial processes.

Latest Patents

Hiroki Wada holds a patent for a "Bristle element for brush and brush roll." This invention provides a brush bristle and a brush roll that exhibit a suitable abrasive force while minimizing the abrasion of a mill roll. The brush bristle is designed for use in a brush roll configured to scour a mill roll for rolling metal sheets. It includes one or more monofilaments made of a thermoplastic resin containing abrasive particles. These abrasive particles possess a hardness lower than that of the mill roll and higher than that of the metal sheet.

Career Highlights

Hiroki Wada is associated with Hotani Co., Ltd., where he applies his expertise in developing innovative brush technologies. His work has contributed to advancements in manufacturing processes, particularly in the metalworking industry.

Conclusion

Hiroki Wada's contributions to brush technology demonstrate his commitment to innovation and efficiency in industrial applications. His patent reflects a deep understanding of material properties and their practical applications in manufacturing.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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