Tokyo, Japan

Hiroki Teranishi

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi Channel Solutions, Corp.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroki Teranishi. Retrieved from https://idiyas.com/inventor/hiroki-teranishi-9khr7fsq

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hiroki Teranishi: Patent Inventor in Maintenance Systems

Introduction

Hiroki Teranishi is an inventor based in Tokyo, Japan, associated with Hitachi Channel Solutions, Corp. His listed patent focuses on coordinating maintenance information and replacement requests between a maintenance company and a manufacturer.

Latest Patents

Teranishi is credited with 1 patent: “Maintenance system and maintenance method.” The invention describes a system in which a maintenance company’s first computer receives information about an equipment defect and sends it to the manufacturer’s third computer. A second computer sends a replacement request to the manufacturer based on a request received from the first computer. The manufacturer’s computer stores the defect information and approves the replacement application when that information matches the replacement request.

Career Highlights

The available information connects Teranishi’s patent work with Hitachi Channel Solutions, Corp. The patent addresses a practical maintenance workflow, linking reported equipment defects with replacement requests and manufacturer approval.

Collaborations

Sho Mizuno is identified as Teranishi’s coworker. The available details do not specify whether Mizuno collaborated on this patent.

Conclusion

Hiroki Teranishi’s listed invention centers on improving how maintenance companies and manufacturers coordinate defect reporting and equipment replacement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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