Kanagawa, Japan

Hiroki Kawasaki

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroki Kawasaki. Retrieved from https://idiyas.com/inventor/hiroki-kawasaki-x2qloj32

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Hiroki Kawasaki: Inventor in Object Detection

Introduction

Hiroki Kawasaki is an inventor associated with Kanagawa, Japan. His patent work includes a method for improving object detection by accounting for the typical locations of objects in images.

Latest Patents

Kawasaki is associated with 1 patent: “Object Detection Considering Tendency of Object Location.” The invention describes a method, computer system, and computer program product for object detection. It uses annotated images containing rectangles around objects and labels identifying their classes to estimate areas where objects of each class are more or less likely to appear. During model validation, the method adjusts prediction confidence values according to an object’s class and rectangle location, then evaluates accuracy across different correction factors to select the one that produces the highest accuracy.

Career Highlights

Kawasaki is associated with International Business Machines Corporation (IBM). His patent reflects work on improving the accuracy of trained object-detection models by incorporating information about object-location patterns.

Collaborations

Kawasaki’s listed coworker is Shingo Nagai. The available information does not specify further details about their collaboration.

Conclusion

Hiroki Kawasaki’s patent presents an approach to object detection that uses location tendencies to refine prediction confidence and improve model accuracy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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