Mishima, Japan

Hiroki Inoue

This inventor holds 1 USPTO granted patent. Top assignee: Eos Gmbh. Active years: 1988.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroki Inoue. Retrieved from https://idiyas.com/inventor/hiroki-inoue-lcldq4ms

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 1988

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1 patent (USPTO):Explore Patents

Title: Hiroki Inoue: Innovator in Water Content Measurement

Introduction

Hiroki Inoue is a notable inventor based in Mishima, Japan. He has made significant contributions to the field of measurement technology, particularly in the development of an apparatus designed to measure the water content of various objects. His innovative approach combines optical technology with precise measurement techniques.

Latest Patents

Hiroki Inoue holds 1 patent for his invention titled "Apparatus for measuring water content." This apparatus utilizes a combination of optical filters to obtain reference and measuring lights, which are essential for accurately determining the water content in an object. The device includes an optical system for irradiating the object, a photoelectric converter for signal conversion, and detectors for temperature and humidity, all working together to provide precise measurements.

Career Highlights

Inoue is currently associated with Eos GmbH, where he continues to innovate and develop new technologies. His work has been instrumental in advancing measurement techniques that are crucial for various applications in science and industry.

Collaborations

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Conclusion

Hiroki Inoue's contributions to measurement technology, particularly through his patented apparatus for measuring water content, highlight his role as an influential inventor in the field. His work continues to impact various industries, showcasing the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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