Hamamatsu, Japan

Hiroki Furuki

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Hamamatsu-Photonics K.k.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroki Furuki. Retrieved from https://idiyas.com/inventor/hiroki-furuki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hiroki Furuki: Inventor of an Improved X-Ray Tube.

Introduction

Hiroki Furuki is an inventor associated with Hamamatsu Photonics K.K. and based in Hamamatsu, Japan. His patent work includes an invention concerning the design of an X-ray tube.

Latest Patents

Furuki is credited with 1 patent, titled “X-ray tube.” The invention describes a tube with a housing, an electron gun that emits an electron beam, and a target that produces X-rays when struck by the beam. The electron gun includes a cathode and a tubular focusing electrode. The electrode’s inner surface has two regions, with the region nearer the target having lower average roughness than the first region. This surface design is part of the patent’s approach to focusing electrons onto the target.

Career Highlights

Furuki’s listed patent connects his work with X-ray tube technology and the engineering of electron-beam components. He is associated with Hamamatsu Photonics K.K., a company whose name is presented in standard capitalization.

Collaborations

Atsushi Ishii is identified as Furuki’s coworker. The available information does not specify whether Ishii collaborated with him on the X-ray tube patent.

Conclusion

Hiroki Furuki’s recorded invention focuses on an X-ray tube and a focusing electrode with differentiated surface roughness, reflecting his association with patent activity in imaging technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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