Nagano, Japan

Hirokazu Koide

This inventor holds 1 USPTO granted patent. Top assignee: Chinon Kabushiki Kaisha. Active years: 1992.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirokazu Koide. Retrieved from https://idiyas.com/inventor/hirokazu-koide

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 1992

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1 patent (USPTO):Explore Patents

Title: Biography of Hirokazu Koide

Introduction: Hirokazu Koide is a notable inventor based in Nagano, Japan. He is recognized for his contributions to image pickup technology, particularly in the development of devices that enhance image reproduction.

Latest Patents: Koide holds a patent for an image pickup apparatus that features a mask for defining the extent of the focal plane of a viewed image. This innovative device includes a linear image sensor that scans the masked area, generating binary data representative of the scanned image. The data controls a printer that reproduces the masked portion of the image, while a data scaling circuit restores the size of the masked image to the printer's full capability, eliminating the need for a zoom lens.

Career Highlights: Koide has made significant strides in the field of imaging technology. His work has led to advancements that improve the efficiency and quality of image reproduction, making a lasting impact on the industry.

Collaborations: Throughout his career, Koide has collaborated with esteemed colleagues, including Wataru Ogura and Hiroshi Kamijima. These partnerships have fostered innovation and contributed to the success of their projects.

Conclusion: Hirokazu Koide's inventive spirit and dedication to advancing image pickup technology have established him as a prominent figure in his field. His patent and collaborations reflect his commitment to innovation and excellence in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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