Tokyo, Japan

Hirokazu Kikuta

USPTO Granted Patents = 2 

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2023-2025

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2 patents (USPTO):Explore Patents

Title: Hirokazu Kikuta: Innovator in Malfunction Analysis Technology

Introduction

Hirokazu Kikuta is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of malfunction analysis technology, holding 2 patents that showcase his innovative approach to problem-solving in complex systems.

Latest Patents

Kikuta's latest patents include a malfunction analysis support program storage medium and a malfunction analysis support apparatus. The malfunction analysis support program enables a computer to perform several critical steps, including log data acquisition, action reproduction, three-dimensional data display, processing, and time synchronization. The log data acquisition step captures log data that records the state of an operational part and input-output data of a control signal. The action reproduction step generates simulation data by causing a virtual object to reproduce actions based on the log data. The three-dimensional data display step presents this simulation data visually, while the time synchronization step ensures that the displayed data is accurately aligned in time. Additionally, his program providing device includes a provision processing unit, an authentication unit, and an operation checking unit, all designed to enhance the functionality of control programs.

Career Highlights

Kikuta is currently employed at Mitsubishi Electric Corporation, where he continues to develop innovative solutions in the field of technology. His work has been instrumental in advancing malfunction analysis techniques, making significant impacts in various applications.

Collaborations

Some of his notable coworkers include Takayuki Yamaoka and Kenji Mine, who contribute to the collaborative environment that fosters innovation at Mitsubishi Electric Corporation.

Conclusion

Hirokazu Kikuta's contributions to malfunction analysis technology reflect his dedication to innovation and problem-solving. His patents demonstrate a commitment to enhancing the efficiency and effectiveness of technological systems.

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