Hitachinaka, Japan

Hiroji Iwata

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi, Ltd.. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroji Iwata. Retrieved from https://idiyas.com/inventor/hiroji-iwata-9cjmol1s

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2003

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Hiroji Iwata: Innovator in Focused Ion Beam Machining

Introduction: Hiroji Iwata is a notable inventor based in Hitachinaka, Japan. He has made significant contributions to the field of machining technology, particularly through his innovative patent related to focused ion beam machining.

Latest Patents: Iwata holds a patent for a focused ion beam machining method and apparatus. This invention involves a sophisticated process where SIM image data is compared to reference image data to calculate the displacement of the machining position. Specifically, the image data just before the nth time is utilized as the reference, allowing for precise matching and calculation of position displacement.

Career Highlights: Iwata is associated with Hitachi, Ltd., a leading company in technology and innovation. His work has contributed to advancements in machining techniques, enhancing the capabilities of focused ion beam technology.

Collaborations: Iwata has collaborated with esteemed colleagues such as Tohru Ishitani and Tsuyoshi Ohnishi. Their combined expertise has fostered innovation and development in their respective fields.

Conclusion: Hiroji Iwata's contributions to focused ion beam machining exemplify the impact of innovative thinking in technology. His patent and collaborations highlight the importance of teamwork in advancing engineering solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…