Gamagori, Japan

Hirohiko Hanai

This inventor holds 1 USPTO granted patent. Top assignee: Nidek Co., Ltd.. Active years: 2000.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirohiko Hanai. Retrieved from https://idiyas.com/inventor/hirohiko-hanai

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 17(Granted Patents)


Company Filing History:


Years Active: 2000

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1 patent (USPTO):Explore Patents

Title: Hirohiko Hanai: Innovator in Ophthalmic Technology

Introduction

Hirohiko Hanai is a notable inventor based in Gamagori, Japan. He has made significant contributions to the field of ophthalmic technology, particularly with his innovative surgical apparatus designed for eye treatment.

Latest Patents

Hirohiko Hanai holds a patent for a corneal surgical apparatus. This ophthalmic operating apparatus includes an observation optical system for observing the anterior part of a patient's eye. It features a laser beam irradiating optical system for delivering treatment, a moving device for adjusting the laser beam's position, an illumination optical system for projecting light from the pupil, and a photographic element for capturing retro-illumination images of the eye.

Career Highlights

Hanai is associated with Nidek Co., Ltd., a company known for its advancements in ophthalmic equipment. His work has contributed to the development of more effective surgical tools that enhance patient outcomes in eye care.

Collaborations

Some of his notable coworkers include Toshifumi Sumiya and Mikio Arashima, who have collaborated with him on various projects within the field of ophthalmology.

Conclusion

Hirohiko Hanai's innovative contributions to ophthalmic technology, particularly through his patented corneal surgical apparatus, highlight his role as a key figure in advancing eye care solutions. His work continues to impact the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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