Muko, Japan

Hirofumi Ota

This inventor holds 1 USPTO granted patent. Top assignee: Omron Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirofumi Ota. Retrieved from https://idiyas.com/inventor/hirofumi-ota-p49cqb53

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Hirofumi Ota: Innovator in Cheating Estimation Technology

Introduction

Hirofumi Ota is a notable inventor based in Muko, Japan. He has made significant contributions to the field of technology, particularly in the area of cheating estimation devices. His innovative approach addresses the challenges associated with detecting cheating in various contexts.

Latest Patents

Hirofumi Ota holds a patent for a "Cheating estimation device, cheating estimation method, and recording medium." This patent describes a device that includes an answer acquisition part, which acquires a character string input into an answer column of a question as an answer. Additionally, it features an operation history information acquisition part that collects operation history information indicating the input operation history of the answer. The estimation part of the device estimates whether cheating has occurred based on the acquired operation history information.

Career Highlights

Ota is currently employed at Omron Corporation, where he continues to develop innovative technologies. His work has garnered attention for its practical applications in educational and testing environments.

Collaborations

Hirofumi Ota collaborates with talented individuals such as Sakuya Araki and Yoshihiro Hirai. Their combined expertise contributes to the advancement of technology in their respective fields.

Conclusion

Hirofumi Ota's contributions to cheating estimation technology highlight his innovative spirit and dedication to improving detection methods. His work at Omron Corporation and his patent demonstrate his commitment to advancing technology for practical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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