This inventor holds 31 USPTO granted patents, primarily in Image Forming Technology. Top assignees: Minolta Camera Kabushiki Kaisha, Minolta Company, Ltd., Lexmark International, Inc.. Active years: 1988-1998.
IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirofumi Hasegawa. Retrieved from https://idiyas.com/inventor/hirofumi-hasegawa
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
% Patents Active = 100.0
Average Co-Inventor Count = 2.5
ph-index = 12
Forward Citations = 385(Granted Patents)
Location History:
- Hatano, JP (1991)
- Azuchi-Machi, Chuo-Ku, Osaka-Shi, Osaka, JP (1992)
- Osaka, JP (1989 - 1993)
- Hadano, JP (1992 - 1994)
- Toyokawa, JP (1988 - 1998)
Company Filing History:
Minolta Camera Kabushiki Kaisha

Minolta Company, Ltd.

Lexmark International, Inc.
4. 1 out of 76
Minolta Camera Co., Ltd.
5. 1 out of 834,513 patents
Other
where one patent can have more than one assignee
Years Active: 1988-1998
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Areas of Expertise:
Image Forming Apparatus
Laser Beam Scanner
Copying Machine
Developing Device
Optical Scanning
Image Reader
Electrophotographic Recorder
Position Indexing Indicators
Compact Image Forming
Image Processing
Shutter Mechanism
Developer Conveying
31 patents (USPTO):Explore Patents
Couldn't find inventor
Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
IDiyas Innovation Intelligence. (2026). Inventor Profile: Hirofumi Hasegawa. Retrieved from https://idiyas.com/inventor/hirofumi-hasegawa
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]