Hino, Japan

Hiroaki Kodaira

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Konica Minolta, Inc.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hiroaki Kodaira. Retrieved from https://idiyas.com/inventor/hiroaki-kodaira

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

 

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Hiroaki Kodaira: Innovator in Image Inspection Technology

Introduction

Hiroaki Kodaira is a notable inventor based in Hino, Japan. He has made significant contributions to the field of image inspection technology. His innovative work has led to the development of a patented device that enhances the accuracy of image analysis.

Latest Patents

Hiroaki Kodaira holds 1 patent for an image inspection device, image forming apparatus, and image inspection method. This device is designed to detect abnormalities in formed images by comparing imaged data obtained through imaging with original image data. The technology includes a hardware processor that adjusts the original image data to reduce sharpness, allowing for more effective detection of abnormalities by comparing the adjusted data with the obtained imaged data.

Career Highlights

Kodaira is currently employed at Konica Minolta, Inc., where he continues to innovate in the field of imaging technology. His work has been instrumental in advancing the capabilities of image inspection devices, making them more reliable and efficient.

Collaborations

He collaborates with talented coworkers, including Yusuke Mimura and Makoto Oki, who contribute to the development and refinement of imaging technologies.

Conclusion

Hiroaki Kodaira's contributions to image inspection technology exemplify the impact of innovative thinking in the field. His patented device represents a significant advancement in the ability to detect image abnormalities, showcasing his expertise and dedication to improving imaging solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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