Merrick, NY, United States of America

Himat Hayer

This inventor holds 1 USPTO granted patent. Top assignee: Scientific Components Corporation. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Himat Hayer. Retrieved from https://idiyas.com/inventor/himat-hayer

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: The Innovations of Himat Hayer

Introduction

Himat Hayer is an accomplished inventor based in Merrick, NY (US). He has made significant contributions to the field of electronics through his innovative designs and patents. His work focuses on enhancing the performance and reliability of surface-mount devices.

Latest Patents

Himat Hayer holds a patent for an "Apparatus for shielding of surface-mount devices." This invention provides a shielding structure for surface-mount components and filters, aimed at increasing signal isolation from the input signal port to the output signal port. The LTCC filter device he developed features improved rejection of undesired frequencies in the stopband while minimizing distortion or loss of desired signals in the passband. He has 1 patent to his name.

Career Highlights

Himat Hayer is currently employed at Scientific Components Corporation, where he continues to innovate and develop new technologies. His expertise in electronic components has made him a valuable asset to the company.

Collaborations

Himat has collaborated with talented coworkers, including Aaron Vaisman and Benjamin Kahtan, to further enhance the capabilities of their projects.

Conclusion

Himat Hayer's contributions to the field of electronics through his innovative patent demonstrate his commitment to advancing technology. His work continues to impact the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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