Pittsburgh, PA, United States of America

Himanshu Jain

This inventor holds 1 USPTO granted patent. Top assignee: Nec Laboratories America, Inc.. Active years: 2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Himanshu Jain. Retrieved from https://idiyas.com/inventor/himanshu-jain-gy2lqydo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 4(Granted Patents)


Company Filing History:


Years Active: 2011

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1 patent (USPTO):Explore Patents

Title: Himanshu Jain: Innovator in Software Verification

Introduction

Himanshu Jain is a notable inventor based in Pittsburgh, PA (US). He has made significant contributions to the field of software verification, showcasing his expertise and innovative spirit. His work focuses on improving the performance of software programs through formal verification methods.

Latest Patents

Himanshu Jain holds a patent for a system and method that enhances the formal verification of software programs. This invention specifically improves the performance of an abstraction-refinement loop within the verification system. His patent is a testament to his commitment to advancing technology in software development.

Career Highlights

Currently, Himanshu Jain is employed at NEC Laboratories America, Inc. His role at this esteemed organization allows him to further his research and development efforts in software verification. With a patent to his name, he has established himself as a key player in his field.

Collaborations

Himanshu has collaborated with notable colleagues such as Franjo Ivancic and Aarti Gupta. These partnerships have likely contributed to the innovative projects and research initiatives he has undertaken.

Conclusion

Himanshu Jain's work in software verification exemplifies the impact of innovation in technology. His contributions not only enhance software performance but also pave the way for future advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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