Goor, Netherlands

Hilbert Bisschop

This inventor holds 1 USPTO granted patent. Top assignee: 501 Hollandse Signaalapparaten B.v.. Active years: 1986.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hilbert Bisschop. Retrieved from https://idiyas.com/inventor/hilbert-bisschop

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 32(Granted Patents)


Company Filing History:


Years Active: 1986

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1 patent (USPTO):Explore Patents

Title: Hilbert Bisschop: Innovator in Pulse Radar Technology

Introduction

Hilbert Bisschop is a notable inventor based in Goor, Netherlands. He has made significant contributions to the field of radar technology, particularly with his innovative designs aimed at improving target tracking systems.

Latest Patents

Bisschop holds a patent for a pulse radar apparatus. This apparatus is designed for target tracking and provides angular error data that represents the deviations of projectiles fired from a gun with respect to the target position line. The low-frequency signal processor of this radar apparatus plays a crucial role in enhancing its functionality.

Career Highlights

Hilbert Bisschop is associated with 501 Hollandse Signaalapparaten B.V., a company known for its advancements in radar and signal processing technologies. His work at this company has allowed him to focus on developing innovative solutions that address complex challenges in target tracking.

Collaborations

Bisschop has collaborated with Bernard Gellekink, a fellow innovator in the field. Their partnership has contributed to the development of advanced radar technologies.

Conclusion

Hilbert Bisschop's contributions to pulse radar technology exemplify his commitment to innovation and excellence in engineering. His work continues to influence advancements in radar systems and target tracking methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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