Hideyuki Ohtake

Title: The Innovative Contributions of Hideyuki Ohtake

Introduction

Hideyuki Ohtake is a notable inventor based in Hyogo, Japan. He has made significant contributions to the field of reliability testing in integrated circuits. His innovative work has led to the development of a unique fault simulator that enhances the efficiency of verifying test patterns.

Latest Patents

Ohtake holds a patent for a fault simulator designed to verify the reliability of test patterns. This fault simulator includes a circuit identifying section that selects fault generation points from timing simulation results obtained by a static timing simulation of an LSI circuit. It features a fault value computing section that generates delay faults corresponding to these points using information about delay time and signal transmission timing. Additionally, the fault simulating section performs logic simulations of both normal and faulty circuits, verifying the detectability of delay faults through comparative analysis. This innovative approach significantly reduces the time required for fault simulation.

Career Highlights

Throughout his career, Ohtake has worked with prominent companies in the technology sector. He has been associated with Renesas Technology Corporation and Mitsubishi Electric System LSI Design Corporation. His experience in these organizations has contributed to his expertise in circuit design and reliability testing.

Collaborations

Ohtake has collaborated with several professionals in his field, including Chika Nishioka and Yoshikazu Akamatsu. These collaborations have further enriched his work and contributed to advancements in fault simulation technology.

Conclusion

Hideyuki Ohtake's contributions to the field of integrated circuit reliability testing are noteworthy. His innovative fault simulator represents a significant advancement in the verification of test patterns, showcasing his expertise and dedication to improving technology.