This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Omron Corporation. Active years: 2013.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2013
Title: Innovations by Hideyuki Hayashi
Introduction
Hideyuki Hayashi is a notable inventor based in Maizuru, Japan. He has made significant contributions to the field of X-ray examination technology. His work focuses on improving the accuracy and efficiency of X-ray examination apparatuses.
Latest Patents
Hayashi holds a patent for an X-ray examination region setting method, X-ray examination apparatus, and X-ray examination region setting program. This invention enables information on a connection wiring with a substrate of a mounted component to be accurately and easily inputted in an X-ray examination apparatus. In the teaching of substrate examination, when a user inputs a two-dimensional region of a component to be examined with respect to a visible light image of the substrate, three-dimensional data is generated for the relevant region. This data is then analyzed to acquire a center coordinate, the number, the number of rows, and the number of columns on a ball terminal connecting the component to the substrate. Results such as the center coordinate acquired in this manner may be displayed. The visible light image for the substrate is displayed in a display field of a screen. In the display field, a frame corresponding to a region acquired as an examination target is displayed in accordance with the visible light image, and a frame corresponding to each solder ball is displayed based on the position and the like of the solder ball acquired based on the three-dimensional data.
Career Highlights
Hayashi is currently associated with Omron Corporation, where he continues to innovate in the field of X-ray technology. His work has been instrumental in enhancing the capabilities of examination apparatuses used in various applications.
Collaborations
Some of his notable coworkers include Kunio Yoshida and Kiyoshi Murakami. Their collaborative efforts contribute to the advancement of technology within their field.
Conclusion
Hideyuki Hayashi's contributions to X-ray examination technology demonstrate his commitment to innovation and improvement in the industry. His patent reflects a significant advancement that enhances the accuracy of examinations, showcasing the importance of his work.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile