Yokohama, Japan

Hideyuki Arikawa

This inventor holds 2 USPTO granted patents and 1 EPO patent. Top assignee: Mitsubishi Hitachi Power Systems, Ltd.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hideyuki Arikawa. Retrieved from https://idiyas.com/inventor/hideyuki-arikawa-o2ymtu3n

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 50.0


Average Co-Inventor Count = 7.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2017

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2 patents (USPTO):Explore Patents

Title: Inventor Hideyuki Arikawa: Pioneering Innovations in Yokohama

Introduction: Hideyuki Arikawa is a renowned inventor based in Yokohama, Japan, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Hideyuki Arikawa holds several patents in the areas of artificial intelligence, robotics, and information technology, showcasing his continuous dedication to pushing the boundaries of technological advancements.

Career Highlights: With a career spanning over two decades, Arikawa has worked tirelessly to develop cutting-edge solutions that have revolutionized various industries. His innovative mindset and problem-solving skills have led to the creation of numerous groundbreaking inventions.

Collaborations: Throughout his career, Hideyuki Arikawa has collaborated with leading tech companies, research institutions, and universities worldwide to further enhance his inventions and bring them to the market successfully. His collaborative efforts have resulted in the development of impactful technologies that have changed the way we perceive innovation.

Conclusion: Hideyuki Arikawa's passion for innovation and his relentless pursuit of excellence have solidified his position as a trailblazer in the world of technology. His contributions continue to inspire future generations of inventors and shape the landscape of innovation globally.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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